APA:
Švegl, Franc, Orel, Boris (2003). The application of FT-IR reflection-absorption spectroscopy for determining the textural properties of copper oxide thin films.
Materiali in tehnologije, letnik 37, številka 1/2, str. 29-31.
URN:NBN:SI:DOC-67KX4MSM from http://www.dlib.si
MLA:
Švegl, Franc, Orel, Boris. "The application of FT-IR reflection-absorption spectroscopy for determining the textural properties of copper oxide thin films."
Materiali in tehnologije letnik 37. številka 1/2 (2003) str. 29-31.
<http://www.dlib.si/?URN=URN:NBN:SI:DOC-67KX4MSM>