APA:
Shijina, V., Adithya, Unni, Sunil, Jacob John (2020). Similarity measure of multiple sets and its application to pattern recognition.
Informatica (Ljubljana), letnik 44, številka 3, str. 335-347.
URN:NBN:SI:DOC-DSENRAOI from http://www.dlib.si
MLA:
Shijina, V., Adithya, Unni, Sunil, Jacob John. "Similarity measure of multiple sets and its application to pattern recognition."
Informatica (Ljubljana) letnik 44. številka 3 (2020) str. 335-347.
<http://www.dlib.si/?URN=URN:NBN:SI:DOC-DSENRAOI>