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Next-generation, advanced thick film multilayer system
Contibutors: LaBranche, Marc H. (author) / McCormick, Cornelius J. (author) / Smith, Jerome D. (author) / Keusseyan, Roupen L. (author) / Mason, Robert C. (author) / Fahey, Mark A. (author) / Needes, Christopher R. S. (author) / Hang, Kenneth W. (author)
Source: Informacije MIDEM
Numbering: 1998, volume 28, issue 4
Provider: Strokovno društvo za mikroelektroniko, elektronske sestavne dele in materiale
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Study of correlation among differential nonlinearity, nonlinearity and noise of thick film resistors
Contibutors: Mach, P. J. (author) / Svasta, P. M. (author)
Source: Informacije MIDEM
Numbering: 1998, volume 28, issue 3
Provider: Strokovno društvo za mikroelektroniko, elektronske sestavne dele in materiale
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