APA:
Chen, Fei, Zhao, Xiaodong, Chen, Huiqin, Ren, Jinyu (2021). Void-closure behavior and a new void-evolution model for various stress states.
Materiali in tehnologije, letnik 55, številka 1, str. 105-113.
URN:NBN:SI:DOC-NFMOSPDQ from http://www.dlib.si
MLA:
Chen, Fei, Zhao, Xiaodong, Chen, Huiqin, Ren, Jinyu. "Void-closure behavior and a new void-evolution model for various stress states."
Materiali in tehnologije letnik 55. številka 1 (2021) str. 105-113.
<http://www.dlib.si/?URN=URN:NBN:SI:DOC-NFMOSPDQ>