APA:
Sikula, Josef, Sedlakova, Vlasta, Dobis, P. (2003). Noise and non-linearity as reliability indicators of electronic devices.
Informacije MIDEM, letnik 33, številka 4, str. 213-221.
URN:NBN:SI:DOC-E3S41NB8 from http://www.dlib.si
MLA:
Sikula, Josef, Sedlakova, Vlasta, Dobis, P.. "Noise and non-linearity as reliability indicators of electronic devices."
Informacije MIDEM letnik 33. številka 4 (2003) str. 213-221.
<http://www.dlib.si/?URN=URN:NBN:SI:DOC-E3S41NB8>