APA:
Mohapatra, S. K., Pradhan, K. P., Pati, G. S., Sahu, P. K. (2015). Relative appraisal of ultra-thin body MOSFETs: an analytical modeling including hot carrier induced degradation.
Informacije MIDEM, letnik 45, številka 1, str. 57-65.
URN:NBN:SI:DOC-APYJP6JM from http://www.dlib.si
MLA:
Mohapatra, S. K., Pradhan, K. P., Pati, G. S., Sahu, P. K.. "Relative appraisal of ultra-thin body MOSFETs: an analytical modeling including hot carrier induced degradation."
Informacije MIDEM letnik 45. številka 1 (2015) str. 57-65.
<http://www.dlib.si/?URN=URN:NBN:SI:DOC-APYJP6JM>