APA:
Yingjie, Yin, Xu, De, Zhang, Zhengtao, Bai, Mingran, Zhang, Feng, Tao, Xian, Wang, Xingang (2015). Surface defect detection on optical devices based on microscopic dark-field scattering imaging.
Strojniški vestnik, letnik 61, številka 1, str. 24-32, SI 6.
URN:NBN:SI:DOC-6PBYX168 from http://www.dlib.si
MLA:
Yingjie, Yin, Xu, De, Zhang, Zhengtao, Bai, Mingran, Zhang, Feng, Tao, Xian, Wang, Xingang. "Surface defect detection on optical devices based on microscopic dark-field scattering imaging."
Strojniški vestnik letnik 61. številka 1 (2015) str. 24-32, SI 6.
<http://www.dlib.si/?URN=URN:NBN:SI:DOC-6PBYX168>