APA:
Manić, Ivica, Danković, Danijel, Prijić, Aneta, Stojadinović, Ninoslav (2014). Measurement of NBTI degradation in p-channel power VDMOSFETs.
Informacije MIDEM, volume 44, issue 4, str. 280-287.
URN:NBN:SI:DOC-Z6PAWFVJ from http://www.dlib.si
MLA:
Manić, Ivica, Danković, Danijel, Prijić, Aneta, Stojadinović, Ninoslav. "Measurement of NBTI degradation in p-channel power VDMOSFETs."
Informacije MIDEM volume 44. issue 4 (2014) str. 280-287.
<http://www.dlib.si/?URN=URN:NBN:SI:DOC-Z6PAWFVJ>