APA:
Jankovec, Marko, Topič, Marko (2007). Development and characterization of a low-frequency noise measurement system for optoelectronic devices.
Informacije MIDEM, volume 37, issue 2, str. 80-86.
URN:NBN:SI:DOC-QO7AIWLH from http://www.dlib.si
MLA:
Jankovec, Marko, Topič, Marko. "Development and characterization of a low-frequency noise measurement system for optoelectronic devices."
Informacije MIDEM volume 37. issue 2 (2007) str. 80-86.
<http://www.dlib.si/?URN=URN:NBN:SI:DOC-QO7AIWLH>