APA:
Trontelj, Janez (2002). Development and analyzis of fast, post-probe silicon wafer inking algorithms.
Informacije MIDEM, volume 32, issue 4, str. 316-319.
URN:NBN:SI:DOC-MFT4IHRO from http://www.dlib.si
MLA:
Trontelj, Janez. "Development and analyzis of fast, post-probe silicon wafer inking algorithms."
Informacije MIDEM volume 32. issue 4 (2002) str. 316-319.
<http://www.dlib.si/?URN=URN:NBN:SI:DOC-MFT4IHRO>