APA:
Fleig, Jürgen (2016). The chemical capacitance as a fingerprint of defect chemistry in mixed conducting oxides.
Acta chimica slovenica, letnik 63, številka 3, str. 509-518.
URN:NBN:SI:DOC-KYXG4OAR from http://www.dlib.si
MLA:
Fleig, Jürgen. "The chemical capacitance as a fingerprint of defect chemistry in mixed conducting oxides."
Acta chimica slovenica letnik 63. številka 3 (2016) str. 509-518.
<http://www.dlib.si/?URN=URN:NBN:SI:DOC-KYXG4OAR>