AES and XPS characterization of titanium hydride powder
Preiskave praška titanovega hidrida s spektroskopijo Augerjevih elektronov in rentgensko fotoelektronsko spektroskopijo

english

2010

volume 44, issue 2

Inštitut za kovinske materiale in tehnologije
(Obvezni izvod spletne publikacije)

Titanium hydride powder, manufactured by ball milling titanium in a hydrogen atmosphere down to micron-sized particles, was analyzed by X-ray Photoelectron Spectroscopy (XPS). A strong titanium oxide signal was also measured, which decreased some what after intense sputtering of the sample, but was impossible to get rid of completely. This was probably due to the high surface/volume ratio of each TiHsubx particle, which contributes to a substantial titanium oxide/TiHsubx ratio, and due to the surface morphology of the powder sample, which leaves a considerable part of the oxide layer shaded during the sputtering. Auger Electron Spectroscopy (AES) was then employed and some characteristic differences in the shape of the Ti LMM spectra between the TiHsubx and Ti were observed; however, they can be ascribed to the TiHsubx only after a comparison with the same types of spectra measured on titanium oxide. An additional XPS measurement was performed with TiHsubx powder and powdered Ti. The peaks were fitted with Ti oxide and metallic Ti components and the shifts of the metallic component between the Ti and TiHsubx (a shift of 0.4 eV was expected) were checked for.

30.01.2012