APA:
Mach, P. J., Svasta, P. M. (1998). Study of correlation among differential nonlinearity, nonlinearity and noise of thick film resistors.
Informacije MIDEM, letnik 28, številka 3, str. 149-153.
URN:NBN:SI:DOC-K3H018VH from http://www.dlib.si
MLA:
Mach, P. J., Svasta, P. M.. "Study of correlation among differential nonlinearity, nonlinearity and noise of thick film resistors."
Informacije MIDEM letnik 28. številka 3 (1998) str. 149-153.
<http://www.dlib.si/?URN=URN:NBN:SI:DOC-K3H018VH>