APA:
Bender, Hugo (2000). Application of focused ion beam for failure analysis.
Informacije MIDEM, volume 30, issue 4, str. 216-222.
URN:NBN:SI:DOC-GPNVJZ30 from http://www.dlib.si
MLA:
Bender, Hugo. "Application of focused ion beam for failure analysis."
Informacije MIDEM volume 30. issue 4 (2000) str. 216-222.
<http://www.dlib.si/?URN=URN:NBN:SI:DOC-GPNVJZ30>