<Record><identifier xmlns="http://purl.org/dc/elements/1.1/">URN:NBN:SI:doc-XJK19PPX</identifier><date>1996</date><creator>Dražić, Goran</creator><relation>documents/doc/X/URN_NBN_SI_doc-XJK19PPX_001.pdf</relation><relation>documents/doc/X/URN_NBN_SI_doc-XJK19PPX_001.txt</relation><format format_type="volume">26</format><format format_type="issue">4</format><format format_type="type">article</format><format format_type="extent">str. 273-279</format><identifier identifier_type="ISSN">0352-9045</identifier><identifier identifier_type="COBISSID">12966951</identifier><identifier identifier_type="URN">URN:NBN:SI:doc-XJK19PPX</identifier><language>eng</language><publisher>Strokovno društvo za mikroelektroniko, elektronske sestavne dele in materiale</publisher><source>Informacije MIDEM</source><rights>InC</rights><subject language_type_id="slv">elektronska mikroskopija</subject><subject language_type_id="slv">kemična analiza</subject><subject language_type_id="slv">keramični materiali</subject><subject language_type_id="slv">lastnosti</subject><subject language_type_id="slv">mikrostruktura</subject><subject language_type_id="slv">tanke plasti</subject><subject language_type_id="slv">tehnična keramika</subject><title>Analitska elektronska mikroskopija sodobnih keramičnih materialov</title><title>Analytical electron microscopy of advanced ceramic materials</title></Record>