<Record><identifier xmlns="http://purl.org/dc/elements/1.1/">URN:NBN:SI:doc-X5L8UQZP</identifier><date>1995</date><creator>Belavič, Darko</creator><creator>Dražić, Goran</creator><creator>Holc, Janez</creator><creator>Hrovat, Marko</creator><creator>Šoba, Stojan</creator><relation>documents/doc/X/URN_NBN_SI_doc-X5L8UQZP_001.pdf</relation><relation>documents/doc/X/URN_NBN_SI_doc-X5L8UQZP_001.txt</relation><format format_type="issue">2</format><format format_type="volume">25</format><format format_type="type">article</format><format format_type="extent">str. 108-114</format><identifier identifier_type="ISSN">0352-9045</identifier><identifier identifier_type="COBISSID">11688999</identifier><identifier identifier_type="URN">URN:NBN:SI:doc-X5L8UQZP</identifier><language>slv</language><publisher>Strokovno društvo za mikroelektroniko, elektronske sestavne dele in materiale</publisher><source>Informacije MIDEM</source><rights>InC</rights><subject language_type_id="slv">debeloplastni upori</subject><subject language_type_id="eng">Electronika</subject><subject language_type_id="slv">elektronika</subject><subject language_type_id="slv">mikrostruktura</subject><subject language_type_id="slv">upori</subject><title>Preiskave debeloplastnih uporov z visokimi faktorji gauge</title></Record>