<Record><identifier xmlns="http://purl.org/dc/elements/1.1/">URN:NBN:SI:doc-WBRIWMCH</identifier><date>2014</date><creator>Belavič, Darko</creator><creator>Cilenšek, Jena</creator><creator>Hrovat, Marko</creator><creator>Makarovič, Kostja</creator><creator>Malič, Barbara</creator><relation>documents/doc/W/URN_NBN_SI_doc-WBRIWMCH_001.pdf</relation><relation>documents/doc/W/URN_NBN_SI_doc-WBRIWMCH_001.txt</relation><format format_type="issue">1</format><format format_type="volume">44</format><format format_type="type">article</format><format format_type="extent">str. 4-11</format><identifier identifier_type="ISSN">0352-9045</identifier><identifier identifier_type="COBISSID">27564583</identifier><identifier identifier_type="URN">URN:NBN:SI:doc-WBRIWMCH</identifier><language>eng</language><publisher>Strokovno društvo za mikroelektroniko, elektronske sestavne dele in materiale</publisher><source>Informacije MIDEM</source><rights>InC</rights><subject language_type_id="slv">debeloplastna tehnologija</subject><subject language_type_id="slv">električne lastnosti</subject><subject language_type_id="slv">mikrostruktura</subject><subject language_type_id="slv">upori</subject><title>Characterisation of thick-film resistors as gauge sensors on different LTCC substrates</title><title>Karakterizacija debeloplastnih uporov kot senzorjev sile na različnih LTCC substratih</title></Record>