<?xml version="1.0"?><rdf:RDF xmlns:dc="http://purl.org/dc/elements/1.1/" xmlns:edm="http://www.europeana.eu/schemas/edm/" xmlns:wgs84_pos="http://www.w3.org/2003/01/geo/wgs84_pos" xmlns:foaf="http://xmlns.com/foaf/0.1/" xmlns:rdaGr2="http://rdvocab.info/ElementsGr2" xmlns:oai="http://www.openarchives.org/OAI/2.0/" xmlns:owl="http://www.w3.org/2002/07/owl#" xmlns:rdf="http://www.w3.org/1999/02/22-rdf-syntax-ns#" xmlns:ore="http://www.openarchives.org/ore/terms/" xmlns:skos="http://www.w3.org/2004/02/skos/core#" xmlns:dcterms="http://purl.org/dc/terms/"><edm:WebResource rdf:about="http://www.dlib.si/stream/URN:NBN:SI:doc-VFW24XEA/0585180d29--4572d7d5840-c6-8cfb95394/PDF"><dcterms:extent>6087 KB</dcterms:extent></edm:WebResource><edm:WebResource rdf:about="http://www.dlib.si/stream/URN:NBN:SI:doc-VFW24XEA/25389481-55d5-4c70-97fc-0d8b286945d0/TEXT"><dcterms:extent>32 KB</dcterms:extent></edm:WebResource><edm:TimeSpan rdf:about="2014-2024"><edm:begin xml:lang="en">2014</edm:begin><edm:end xml:lang="en">2024</edm:end></edm:TimeSpan><edm:ProvidedCHO rdf:about="URN:NBN:SI:doc-VFW24XEA"><dcterms:isPartOf rdf:resource="https://www.dlib.si/details/URN:NBN:SI:spr-OE00UKYR" /><dcterms:issued>2020</dcterms:issued><dc:creator>Kamšek, Ana Rebeka</dc:creator><dc:format xml:lang="sl">11 str.</dc:format><dc:format xml:lang="sl">številka:2</dc:format><dc:format xml:lang="sl">letnik:7</dc:format><dc:identifier>ISSN:2385-8567</dc:identifier><dc:identifier>COBISSID_HOST:29325571</dc:identifier><dc:identifier>URN:URN:NBN:SI:doc-VFW24XEA</dc:identifier><dc:language>en</dc:language><dc:publisher xml:lang="sl">Založba Fakultete za matematiko in fiziko Univerze v Ljubljani</dc:publisher><dcterms:isPartOf xml:lang="sl">Matrika</dcterms:isPartOf><dc:subject xml:lang="en">electrocatalysis</dc:subject><dc:subject xml:lang="en">electron microscopy</dc:subject><dc:subject xml:lang="sl">elektrokataliza</dc:subject><dc:subject xml:lang="sl">elektronska mikroskopija</dc:subject><dc:subject xml:lang="en">microscope</dc:subject><dc:subject xml:lang="sl">mikroskop</dc:subject><dcterms:temporal rdf:resource="2014-2024" /><dc:title xml:lang="sl">Transmission electron microscopy|</dc:title><dc:description xml:lang="sl">The article presents transmission electron microscopy, arguably the most versatile technique for characterization of different materials on a scale down to less than a nanometer. Different parts of the microscope are described and the fundamental physical processes that make this technique possible are explained. Lastly, two interesting examples from the science of electrocatalysis, where measurements using transmission electron microscopy were extremely valuable, are discussed</dc:description><dc:description xml:lang="sl">V članku je predstavljena presevna elektronska mikroskopija, ki je ena najbolj vsestranskih metod za karakterizacijo različnih materialov z ločljivostjo pod enim nanometrom. Opisani in razloženi so različni sestavni deli mikroskopa ter fizikalni procesi, ki omogočajo njegovo delovanje. Na koncu sta predstavljena dva zanimiva primera iz področja elektrokatalize, kjer je bila uporaba te tehnike še posebej v pomoč</dc:description><edm:type>TEXT</edm:type><dc:type xml:lang="sl">znanstveno časopisje</dc:type><dc:type xml:lang="en">journals</dc:type><dc:type rdf:resource="http://www.wikidata.org/entity/Q361785" /></edm:ProvidedCHO><ore:Aggregation rdf:about="http://www.dlib.si/?URN=URN:NBN:SI:doc-VFW24XEA"><edm:aggregatedCHO rdf:resource="URN:NBN:SI:doc-VFW24XEA" /><edm:isShownBy rdf:resource="http://www.dlib.si/stream/URN:NBN:SI:doc-VFW24XEA/0585180d29--4572d7d5840-c6-8cfb95394/PDF" /><edm:rights rdf:resource="http://rightsstatements.org/vocab/InC/1.0/" /><edm:provider>Slovenian National E-content Aggregator</edm:provider><edm:dataProvider xml:lang="en">National and University Library of Slovenia</edm:dataProvider><edm:object rdf:resource="http://www.dlib.si/streamdb/URN:NBN:SI:doc-VFW24XEA/maxi/edm" /><edm:isShownAt rdf:resource="http://www.dlib.si/details/URN:NBN:SI:doc-VFW24XEA" /></ore:Aggregation></rdf:RDF>