<Record><identifier xmlns="http://purl.org/dc/elements/1.1/">URN:NBN:SI:doc-V1URIJVE</identifier><date>2009</date><creator>Sites, James R.</creator><relation>documents/doc/V/URN_NBN_SI_doc-V1URIJVE_001.pdf</relation><relation>documents/doc/V/URN_NBN_SI_doc-V1URIJVE_001.txt</relation><format format_type="volume">39</format><format format_type="issue">4</format><format format_type="type">article</format><format format_type="extent">str. 220-222</format><identifier identifier_type="ISSN">0352-9045</identifier><identifier identifier_type="COBISSID">256881152</identifier><identifier identifier_type="URN">URN:NBN:SI:doc-V1URIJVE</identifier><language>eng</language><publisher>Strokovno društvo za mikroelektroniko, elektronske sestavne dele in materiale</publisher><source>Informacije MIDEM</source><rights>InC</rights><subject language_type_id="slv">fotovoltaika</subject><subject language_type_id="slv">meje kristalnega zrna</subject><subject language_type_id="slv">tankoplastna tehnologija</subject><title>Vpliv mej med zrni na tankoplastno fotovoltaiko</title><title>Impact of grain boundaries on thin-film photovoltaics</title></Record>