URN:NBN:SI:doc-V1OD4H432007Coym, TorstenHellebrand, SybilleLudwig, StefanStraube, BerndWunderlich, Hans-JoachimZoellin, Christian G.documents/doc/V/URN_NBN_SI_doc-V1OD4H43_001.pdfdocuments/doc/V/URN_NBN_SI_doc-V1OD4H43_001.txt374articlestr. 212-2190352-90456543188URN:NBN:SI:doc-V1OD4H43engStrokovno društvo za mikroelektroniko, elektronske sestavne dele in materialeInformacije MIDEMInCkvalitetanačrtovanjenanoelektronski sistemipreizkušanjeTesting and monitoring nanoscale systems - challenges and strategies for advanced quality assurance