<Record><identifier xmlns="http://purl.org/dc/elements/1.1/">URN:NBN:SI:doc-SHEHGEJN</identifier><date>2008</date><creator>Flack, Howard D.</creator><relation>documents/znanstveni_clanki/acta_chimica_slovenica/html/URN_NBN_SI_doc-SHEHGEJN.html</relation><relation>documents/znanstveni_clanki/acta_chimica_slovenica/pdf/URN_NBN_SI_doc-SHEHGEJN.pdf</relation><relation>documents/znanstveni_clanki/acta_chimica_slovenica/txt/URN_NBN_SI_doc-SHEHGEJN.txt</relation><format format_type="issue">4</format><format format_type="volume">55</format><format format_type="type">article</format><format format_type="extent">str. 689-691</format><identifier identifier_type="ISSN">1318-0207</identifier><identifier identifier_type="COBISSID">246939392</identifier><identifier identifier_type="URN">URN:NBN:SI:doc-SHEHGEJN</identifier><language>eng</language><publisher>Slovensko kemijsko društvo</publisher><source>Acta chimica slovenica</source><rights>BY</rights><subject language_type_id="slv">analizna kemija</subject><subject language_type_id="slv">konfiguracija</subject><subject language_type_id="slv">rentgenska praškovna difrakcija</subject><subject language_type_id="slv">struktura</subject><title>The use of x-ray crystallography to determine absolute configuration (II)</title></Record>