<Record><identifier xmlns="http://purl.org/dc/elements/1.1/">URN:NBN:SI:doc-QO5KWNID</identifier><date>2001</date><creator>Čekada, Miha</creator><creator>Panjan, Peter</creator><relation>documents/znanstveni_clanki/vakuumist/html/urn_nbn_si_doc-qo5kwnid.html</relation><relation>documents/znanstveni_clanki/vakuumist/pdf/urn_nbn_si_doc-qo5kwnid.pdf</relation><relation>documents/znanstveni_clanki/vakuumist/txt/urn_nbn_si_doc-qo5kwnid.txt</relation><format format_type="issue">1</format><format format_type="volume">21</format><format format_type="main">4 strani</format><format format_type="type">article</format><format format_type="extent">str. 17-20</format><identifier identifier_type="ISSN">0351-9716</identifier><identifier identifier_type="COBISSID">15965991</identifier><identifier identifier_type="URN">URN:NBN:SI:doc-QO5KWNID</identifier><language>slv</language><publisher>Društvo za vakuumsko tehniko Slovenije</publisher><source>Vakuumist</source><rights>InC</rights><subject language_type_id="slv">elektronska mikroskopija</subject><subject language_type_id="slv">ionsko jedkanje</subject><subject language_type_id="slv">priprava vzorcev</subject><subject language_type_id="slv">tanke plasti</subject><title>Preparation of thin samples for transmission electron microscopy</title><title>Priprava tankoplastnih vzorcev za presevno elektronsko mikroskopijo</title></Record>