<Record><identifier xmlns="http://purl.org/dc/elements/1.1/">URN:NBN:SI:doc-QKFRKI8V</identifier><date>1988</date><creator>Maček, Marijan</creator><relation>documents/doc/Q/URN_NBN_SI_doc-QKFRKI8V_001.pdf</relation><relation>documents/doc/Q/URN_NBN_SI_doc-QKFRKI8V_001.txt</relation><format format_type="volume">18</format><format format_type="issue">2</format><format format_type="type">article</format><identifier identifier_type="ISSN">0352-9045</identifier><identifier identifier_type="COBISSID">6804482</identifier><identifier identifier_type="URN">URN:NBN:SI:doc-QKFRKI8V</identifier><language>slv</language><publisher>Strokovno društvo za mikroelektroniko, elektronske sestavne dele in materiale</publisher><source>Informacije MIDEM</source><rights>InC</rights><subject language_type_id="slv">defekti</subject><subject language_type_id="slv">integralna vezja</subject><subject language_type_id="slv">polprevodniki</subject><title>Intrinzično getranje in inženiring defektov</title></Record>