<Record><identifier xmlns="http://purl.org/dc/elements/1.1/">URN:NBN:SI:doc-QJRKGUQB</identifier><date>2015</date><creator>Bürmen, Arpad</creator><creator>Habal, Husni</creator><relation>documents/doc/Q/URN_NBN_SI_doc-QJRKGUQB_001.pdf</relation><relation>documents/doc/Q/URN_NBN_SI_doc-QJRKGUQB_001.txt</relation><format format_type="issue">2</format><format format_type="volume">45</format><format format_type="type">article</format><format format_type="extent">str. 160-170</format><identifier identifier_type="ISSN">0352-9045</identifier><identifier identifier_type="COBISSID">280601856</identifier><identifier identifier_type="URN">URN:NBN:SI:doc-QJRKGUQB</identifier><language>eng</language><publisher>Strokovno društvo za mikroelektroniko, elektronske sestavne dele in materiale</publisher><source>Informacije MIDEM</source><rights>InC</rights><subject language_type_id="slv">adaptivni mrežni direktni optimizacijski postopki</subject><subject language_type_id="slv">centriranje</subject><subject language_type_id="slv">mikroelektronika</subject><subject language_type_id="slv">načrtovanje analognih vezij</subject><title>Computing worst-case performance and yield of analog integrated circuits by means of mesh adaptive direct search</title><title>Določanje najslabših lastnosti in izplena analognih integriranih vezij z adaptivnim mrežnim direktnim optimizacijskim postopkom</title></Record>