<Record><identifier xmlns="http://purl.org/dc/elements/1.1/">URN:NBN:SI:doc-KT77Y68C</identifier><date>2019</date><creator>Pušnik, Igor</creator><relation>documents/doc/K/URN_NBN_SI_doc-KT77Y68C_001.pdf</relation><relation>documents/doc/K/URN_NBN_SI_doc-KT77Y68C_001.txt</relation><format format_type="type">article</format><format format_type="extent">Str. 177-180</format><identifier identifier_type="COBISSID_HOST">12742740</identifier><identifier identifier_type="ISSN">2591-0442</identifier><identifier identifier_type="URN">URN:NBN:SI:doc-KT77Y68C</identifier><language>slv</language><publisher publisher_location="Ljubljana">Društvo Slovenska sekcija IEEE</publisher><source>Zbornik mednarodne Elektrotehniške in računalniške konference</source><rights>InC</rights><subject language_type_id="eng">radiation thermometer</subject><subject language_type_id="slv">sevalni termometer</subject><subject language_type_id="eng">size-of-source effect</subject><subject language_type_id="slv">temperatura</subject><subject language_type_id="eng">temperature</subject><subject language_type_id="slv">vpliv velikosti vira</subject><title>Vpliv velikosti vira referenčnih sevalnih termometrov v LMK</title></Record>