592 KB22 KB198520252001Mikola, LadislavMohorko, Jožeštevilka:3letnik:31str. 178-184ISSN:0352-9045COBISSID:6756886URN:URN:NBN:SI:doc-KQO92DKRslStrokovno društvo za mikroelektroniko, elektronske sestavne dele in materialeInformacije MIDEMelektronski elementinapetostpreizkušanjestatične karakteristiketokAdaptivna metoda merjenja statičnih karakteristik elektronskih komponent in njena realizacija z virtualnim instrumentom| Adaptive method for the measurement of statical characteristics of electronics parts and its realisation as virtual instrument|An approach to the computer-aided measurement of static characteristics is described. There are two basic criteria for choosing the number of measurement points: the speed of measurement performance and the continuity of the measured characteristic, which are contradictory. The approach is based on the adaptive method for choosing a limited set of measuring points with a uniform distribution along the characteristic, without the need for apriori knowledge about measured parts, limited by maximum permitted power, current and voltage. The approach is implemented as Virtual Instrument (VI) using LabView from national Instruments. The results of experimental of statical characteristics of different types of electronic elements, such as resistor zener diode, transistor and trystor, confirm the efficiency of the presented method even in the case of choosing a relatively small number of measurement points (10-15)V članku opisujemo računalniško podprt postopek določanja statičnih l - U karakteristik elektronskih elementov. Osnovna kriterija izbire števila merilnih točk na karakteristiki sta hitrost meritve in zveznost izmerjene karakteristike, ki pa sta protislovna. Postopek temelji na adaptivni metodi izbiranja omejenega števila maksimalne merilnih točk tako, da so enakomerno razporejene po kakrakteristiki, brez vnaprejšnjega poznavanja lastnosti merjenca, ob omejitvah dovoljene moči, toka in napetosti. Realiziran je v obliki virtualnega instrumenta v programskem okolju LabView firme National Instruments. Rezultati meritev statičnih karakteristik različnih tipov merjencev, kot so: upor, dioda, tranzistor, zener dioda in tristor, potrjujejo uspešnost predstavljene metode tudi v primerih izbire dokaj malega števila merilnih točk (10-15)TEXTznanstveno časopisjejournalsSlovenian National E-content AggregatorNational and University Library of SloveniaStrokovno društvo za mikroelektroniko, elektronske sestavne dele in materiale