<Record><identifier xmlns="http://purl.org/dc/elements/1.1/">URN:NBN:SI:doc-KHIWTJZ6</identifier><date>1998</date><creator>Solar, Stanislav</creator><relation>documents/doc/K/URN_NBN_SI_doc-KHIWTJZ6_001.pdf</relation><relation>documents/doc/K/URN_NBN_SI_doc-KHIWTJZ6_001.txt</relation><format format_type="issue">1</format><format format_type="volume">28</format><format format_type="type">article</format><format format_type="extent">str. 9-17</format><identifier identifier_type="ISSN">0352-9045</identifier><identifier identifier_type="COBISSID">1243476</identifier><identifier identifier_type="URN">URN:NBN:SI:doc-KHIWTJZ6</identifier><language>slv</language><publisher>Strokovno društvo za mikroelektroniko, elektronske sestavne dele in materiale</publisher><source>Informacije MIDEM</source><rights>InC</rights><subject language_type_id="slv">električne lastnosti</subject><subject language_type_id="slv">integrirana vezja</subject><subject language_type_id="slv">tokovni izvori</subject><subject language_type_id="slv">vpliv temperature</subject><title>Temperaturno in napetostno stabilni tokovni izvori v pod mikrometerskih tehnologijah</title><title>Voltage and temperature indenpendent current sources in submicron technologies</title></Record>