<Record><identifier xmlns="http://purl.org/dc/elements/1.1/">URN:NBN:SI:doc-JP35AZ9Y</identifier><date>1997</date><creator>Sinnadurai, Nihal</creator><relation>documents/doc/J/URN_NBN_SI_doc-JP35AZ9Y_001.pdf</relation><relation>documents/doc/J/URN_NBN_SI_doc-JP35AZ9Y_001.txt</relation><format format_type="volume">27</format><format format_type="issue">3</format><format format_type="type">article</format><format format_type="extent">str. 165-171</format><identifier identifier_type="ISSN">0352-9045</identifier><identifier identifier_type="COBISSID">1252692</identifier><identifier identifier_type="URN">URN:NBN:SI:doc-JP35AZ9Y</identifier><language>eng</language><publisher>Strokovno društvo za mikroelektroniko, elektronske sestavne dele in materiale</publisher><source>Informacije MIDEM</source><rights>InC</rights><subject language_type_id="eng">Electronika</subject><subject language_type_id="slv">elektronika</subject><subject language_type_id="slv">integrirana vezja</subject><subject language_type_id="slv">mikroelektronika</subject><subject language_type_id="slv">VLSI</subject><title>Testability, a vital ingredient for MCM technology</title><title>Testabilnost, pomemben dejavnik za MCM tehnologijo</title></Record>