<Record><identifier xmlns="http://purl.org/dc/elements/1.1/">URN:NBN:SI:doc-EKGLTBD6</identifier><date>2007</date><creator>Biasizzo, Anton</creator><relation>documents/doc/E/URN_NBN_SI_doc-EKGLTBD6_001.pdf</relation><relation>documents/doc/E/URN_NBN_SI_doc-EKGLTBD6_001.txt</relation><format format_type="issue">3</format><format format_type="volume">37</format><format format_type="type">article</format><format format_type="extent">str. 146-151</format><identifier identifier_type="ISSN">0352-9045</identifier><identifier identifier_type="COBISSID">21584423</identifier><identifier identifier_type="URN">URN:NBN:SI:doc-EKGLTBD6</identifier><language>eng</language><publisher>Strokovno društvo za mikroelektroniko, elektronske sestavne dele in materiale</publisher><source>Informacije MIDEM</source><rights>InC</rights><subject language_type_id="slv">integrirana vezja z vgrajeno preizkusno linijo</subject><subject language_type_id="slv">vdori</subject><title>Analysis of potential attack scenarios for systems with IEEE STD 1149.1 security extension</title></Record>