{"?xml":{"@version":"1.0"},"edm:RDF":{"@xmlns:dc":"http://purl.org/dc/elements/1.1/","@xmlns:edm":"http://www.europeana.eu/schemas/edm/","@xmlns:wgs84_pos":"http://www.w3.org/2003/01/geo/wgs84_pos","@xmlns:foaf":"http://xmlns.com/foaf/0.1/","@xmlns:rdaGr2":"http://rdvocab.info/ElementsGr2","@xmlns:oai":"http://www.openarchives.org/OAI/2.0/","@xmlns:owl":"http://www.w3.org/2002/07/owl#","@xmlns:rdf":"http://www.w3.org/1999/02/22-rdf-syntax-ns#","@xmlns:ore":"http://www.openarchives.org/ore/terms/","@xmlns:skos":"http://www.w3.org/2004/02/skos/core#","@xmlns:dcterms":"http://purl.org/dc/terms/","edm:WebResource":[{"@rdf:about":"http://www.dlib.si/stream/URN:NBN:SI:doc-C9O5JORJ/c32425e7-f24f-492a-af50-0e5d23eeab8c/PDF","dcterms:extent":"404 KB"},{"@rdf:about":"http://www.dlib.si/stream/URN:NBN:SI:doc-C9O5JORJ/31e3fd0c-8608-4769-9fe8-4e293122067a/TEXT","dcterms:extent":"17 KB"}],"edm:TimeSpan":{"@rdf:about":"1985-2025","edm:begin":{"@xml:lang":"en","#text":"1985"},"edm:end":{"@xml:lang":"en","#text":"2025"}},"edm:ProvidedCHO":{"@rdf:about":"URN:NBN:SI:doc-C9O5JORJ","dcterms:isPartOf":[{"@rdf:resource":"https://www.dlib.si/details/URN:NBN:SI:spr-Z2J12Z6C"},{"@xml:lang":"sl","#text":"Informacije MIDEM"}],"dcterms:issued":"1998","dc:creator":["Mozetič, Miran","Praček, Borut"],"dc:format":[{"@xml:lang":"sl","#text":"letnik:28"},{"@xml:lang":"sl","#text":"številka:3"},{"@xml:lang":"sl","#text":"str. 171-174"}],"dc:identifier":["ISSN:0352-9045","COBISSID:29666","URN:URN:NBN:SI:doc-C9O5JORJ"],"dc:language":"en","dc:publisher":{"@xml:lang":"sl","#text":"Strokovno društvo za mikroelektroniko, elektronske sestavne dele in materiale"},"dc:subject":[{"@xml:lang":"sl","#text":"čiščenje"},{"@xml:lang":"sl","#text":"korozija"},{"@xml:lang":"sl","#text":"plazma"},{"@xml:lang":"sl","#text":"površine"},{"@xml:lang":"sl","#text":"srebro"}],"dcterms:temporal":{"@rdf:resource":"1985-2025"},"dc:title":{"@xml:lang":"sl","#text":"Interaction of hydrogen plasma with corroded silver surface| Interakcija vodikove plazme s korodirano površino srebra|"},"dc:description":[{"@xml:lang":"sl","#text":"Experimental investigation on discharage cleaning of corroded silver surface has been performed. Samples of silver with a thin and thick corroded layer were used. In the case of a thin layer, the surfce of pure silwer was contaminated with fingerprints. AES analysis showed that the layer with the thickness of 20 nm consisting of O, S, Cl and C was formed. In the case of a thick layer, a well corroded silver coin from 19th century was used. In this case, the thickness of the corroded layer was in the order of 0,1 mm and the EMPA investigation showed it was an agglomerate consisting of O, S, Cl, Si, C, Fe, Ti. All samples were exposed to a low pressure weakly ionized hydrogen plasma at the pressure of 1 mbar. Plasma parameters were measured with a double Langmuir probe and a calalytic probe. The electron temperature was 6eV, plasma density 2.10sup16 msup-3, and the degree od dissociation of hydrogen moleculs about 1%. Samples with the thin corroded layer were exposed to plasma for 10 minutes. AES analysis of the treated samples showed that all impurities were completely removed from the surface. The coin was exposed to hydrogen plasma at the same conditions, and the EMPA analysis showed that concentration of oxidizing impurities was lowered but other impurities still persisted. They could not be removed solely by treatments in plasma, but successive treatment in plasma and ultrasound bath. By the combination of both treatments we were able to decrease the concentration of any impurities below the detection limit of the EMPA"},{"@xml:lang":"sl","#text":"Prikazujemo rezultate eksperimentalne preiskave plazemskega čiščenja korodirane površine srebra. Uporabili smo srebrne vzorce s tanko in debelo korodirano plastjo. V primeru tanke korodirane plasti smo površino čistega srebra kontaminirali s prstnimi odtisi. AES preiskava teh vzorcev je pokazala, da je na površini prisotna tanka plast nečistoč debeline 20 nm, ki vsebuje poleg srebra še O, S, Cl in C. V primeru debele plasti smo izbrali močno korodiran srebrni kovanec iz 19. stoletja. V tem primeru je bila debelina korodirane plasti reda velikosti 0,1 mm. Preiskava vzorca z elektronskim mikroanalizatorjem je pokazala, da površinski aglomerat vsebuje naslednje elemente: O, S, Cl, Si, C, Fe in Ti. Vsi vzorci so bili izpostavljeni nizkotlačni šibkoionizirani vodikovi plazmi pri tlaku 1 mbar. Plazemske parametre smo merili z dvojno Langmuirjevo sondo in katalitično sondo. Elektronska temperatura je bila 6 eV, gostota plazme 2x10na16 mna-3 in stopnja disociiranosti vodikovih molekul okoli 1%. Vzorci s tanko korodirano plastjo so bili izpostavljeni vodikovi plazmi za 10 minut. AES preiskava tako obdelanih vzorcev je pokazala, da smo odstranili vse nečistoče površin. Kovanec je bil izpostavljen vodikovi plazmi pri enakih pogojih in analiza z elektronskim mikroanalizatorjem je pokazala, da je po obdelavi koncentracija oksidativnih nečistoč bistveno zmanjšana, medtem ko so ostale nečistoče na površini še vedno prisotne. Slednje nismo uspeli odstraniti samo s plazemskim čiščenjem temveč smo jih uspešno odstranili s kombinacijo plazemskega in ultrazvočnega čiščenja. S kombinacijo obeh meatod smo uspeli kovanec tako dobro očistiti, da je koncentracija katerihkoli nečistoč na površini manjša kot je meja detekcije elektronskega moikroanalizatorja"}],"edm:type":"TEXT","dc:type":[{"@xml:lang":"sl","#text":"znanstveno časopisje"},{"@xml:lang":"en","#text":"journals"},{"@rdf:resource":"http://www.wikidata.org/entity/Q361785"}]},"ore:Aggregation":{"@rdf:about":"http://www.dlib.si/?URN=URN:NBN:SI:doc-C9O5JORJ","edm:aggregatedCHO":{"@rdf:resource":"URN:NBN:SI:doc-C9O5JORJ"},"edm:isShownBy":{"@rdf:resource":"http://www.dlib.si/stream/URN:NBN:SI:doc-C9O5JORJ/c32425e7-f24f-492a-af50-0e5d23eeab8c/PDF"},"edm:rights":{"@rdf:resource":"http://rightsstatements.org/vocab/InC/1.0/"},"edm:provider":"Slovenian National E-content Aggregator","edm:intermediateProvider":{"@xml:lang":"en","#text":"National and University Library of Slovenia"},"edm:dataProvider":{"@xml:lang":"sl","#text":"Strokovno društvo za mikroelektroniko, elektronske sestavne dele in materiale"},"edm:object":{"@rdf:resource":"http://www.dlib.si/streamdb/URN:NBN:SI:doc-C9O5JORJ/maxi/edm"},"edm:isShownAt":{"@rdf:resource":"http://www.dlib.si/details/URN:NBN:SI:doc-C9O5JORJ"}}}}