<Record><identifier xmlns="http://purl.org/dc/elements/1.1/">URN:NBN:SI:doc-754LD879</identifier><date>2000</date><creator>Aljančič, Uroš</creator><creator>Amon, Slavko</creator><creator>Resnik, Drago</creator><creator>Vrtačnik, Danilo</creator><relation>documents/doc/7/URN_NBN_SI_doc-754LD879_001.pdf</relation><relation>documents/doc/7/URN_NBN_SI_doc-754LD879_001.txt</relation><format format_type="issue">1</format><format format_type="volume">30</format><format format_type="type">article</format><format format_type="extent">str. 20-31</format><identifier identifier_type="ISSN">0352-9045</identifier><identifier identifier_type="COBISSID">1820244</identifier><identifier identifier_type="URN">URN:NBN:SI:doc-754LD879</identifier><language>eng</language><publisher>Strokovno društvo za mikroelektroniko, elektronske sestavne dele in materiale</publisher><source>Informacije MIDEM</source><rights>InC</rights><subject language_type_id="slv">bondiranje</subject><subject language_type_id="slv">hrapavost</subject><subject language_type_id="slv">natezna trdnost</subject><subject language_type_id="slv">polprevodniki</subject><subject language_type_id="slv">površinska obdelava</subject><title>Direct bonding of (111) and (100) oriented silicon wafers</title><title>Direktno bondiranje silicijevih ploščic orientacije (100) in (111)</title></Record>