<Record><identifier xmlns="http://purl.org/dc/elements/1.1/">URN:NBN:SI:doc-6PI08D02</identifier><date>1997</date><creator>Born, Axel</creator><creator>Wiesendanger, Roland</creator><relation>documents/doc/6/URN_NBN_SI_doc-6PI08D02_001.pdf</relation><relation>documents/doc/6/URN_NBN_SI_doc-6PI08D02_001.txt</relation><format format_type="volume">27</format><format format_type="issue">4</format><format format_type="type">article</format><format format_type="extent">str. 246-250</format><identifier identifier_type="ISSN">0352-9045</identifier><identifier identifier_type="COBISSID">1254484</identifier><identifier identifier_type="URN">URN:NBN:SI:doc-6PI08D02</identifier><language>eng</language><publisher>Strokovno društvo za mikroelektroniko, elektronske sestavne dele in materiale</publisher><source>Informacije MIDEM</source><rights>InC</rights><subject language_type_id="slv">elektronska mikroskopija</subject><subject language_type_id="slv">elektronska vezja</subject><subject language_type_id="slv">nanotehnologija</subject><subject language_type_id="slv">polprevodniki</subject><subject language_type_id="slv">spektroskopija</subject><title>from basic research to industrial applications</title><title>od osnovnih raziskav do uporabe v industriji</title><title>Scanning probe microscopy and spectroscopy</title><title>Vrstična mikroskopija in spektroskopija s sondo</title></Record>