<Record><identifier xmlns="http://purl.org/dc/elements/1.1/">URN:NBN:SI:doc-5TP36C3P</identifier><date>2009</date><creator>Aljančič, Uroš</creator><creator>Amon, Slavko</creator><creator>Možek, Matej</creator><creator>Penič, Samo</creator><creator>Resnik, Drago</creator><creator>Vrtačnik, Danilo</creator><relation>documents/doc/5/URN_NBN_SI_doc-5TP36C3P_001.pdf</relation><relation>documents/doc/5/URN_NBN_SI_doc-5TP36C3P_001.txt</relation><format format_type="issue">1</format><format format_type="volume">39</format><format format_type="type">article</format><format format_type="extent">str. 85-92</format><identifier identifier_type="ISSN">0352-9045</identifier><identifier identifier_type="COBISSID">7570516</identifier><identifier identifier_type="URN">URN:NBN:SI:doc-5TP36C3P</identifier><language>eng</language><publisher>Strokovno društvo za mikroelektroniko, elektronske sestavne dele in materiale</publisher><source>Informacije MIDEM</source><rights>InC</rights><subject language_type_id="slv">karakterizacija</subject><subject language_type_id="slv">piezoelektrični koeficient</subject><subject language_type_id="slv">piezoelektriki</subject><subject language_type_id="slv">silicij</subject><subject language_type_id="slv">tanke plasti</subject><title>Cantilever method for determination of D31 coefficient in thin piezoelectric films</title><title>Metoda za določanje koeficienta d31 tankih piezoelektričnih filmov</title></Record>