<Record><identifier xmlns="http://purl.org/dc/elements/1.1/">URN:NBN:SI:doc-2ZRFRERO</identifier><date>1989</date><creator>Kolenko, Štefka</creator><creator>Likar, Igor</creator><relation>documents/doc/2/URN_NBN_SI_doc-2ZRFRERO_001.pdf</relation><relation>documents/doc/2/URN_NBN_SI_doc-2ZRFRERO_001.txt</relation><format format_type="volume">19</format><format format_type="extent">19, št. 3 (september 1989), str. 127-131</format><format format_type="issue">3</format><format format_type="type">article</format><identifier identifier_type="ISSN">0352-9045</identifier><identifier identifier_type="COBISSID">14250754</identifier><identifier identifier_type="URN">URN:NBN:SI:doc-2ZRFRERO</identifier><language>eng</language><publisher>Strokovno društvo za mikroelektroniko, elektronske sestavne dele in materiale</publisher><source>Informacije MIDEM</source><rights>InC</rights><subject language_type_id="slv">kovinski plastni upori</subject><subject language_type_id="slv">preskušanje</subject><title>Accelerated test procedure for estimating proportion of early failures of metal film resistors</title></Record>