<Record><identifier xmlns="http://purl.org/dc/elements/1.1/">URN:NBN:SI:doc-1PIGI6FD</identifier><date>1996</date><creator>Drobnič, Matija</creator><creator>Mozetič, Miran</creator><creator>Praček, Borut</creator><relation>documents/doc/1/URN_NBN_SI_doc-1PIGI6FD_001.pdf</relation><relation>documents/doc/1/URN_NBN_SI_doc-1PIGI6FD_001.txt</relation><format format_type="issue">1</format><format format_type="volume">26</format><format format_type="type">article</format><format format_type="extent">str. 32-34</format><identifier identifier_type="ISSN">0352-9045</identifier><identifier identifier_type="COBISSID">17060869</identifier><identifier identifier_type="URN">URN:NBN:SI:doc-1PIGI6FD</identifier><language>eng</language><publisher>Strokovno društvo za mikroelektroniko, elektronske sestavne dele in materiale</publisher><source>Informacije MIDEM</source><rights>InC</rights><subject language_type_id="slv">elektrodifuzija</subject><subject language_type_id="slv">elektronska spektroskopija</subject><subject language_type_id="slv">optoelektronika</subject><subject language_type_id="slv">spektroskopija</subject><subject language_type_id="slv">večplastne strukture</subject><title>AES characterization and analytical description of potassium migration in microchannel plates multilayers</title></Record>