<Record><identifier xmlns="http://purl.org/dc/elements/1.1/">URN:NBN:SI:doc-05YC30MY</identifier><date>1997</date><creator>Ambrožič, Milan</creator><relation>documents/znanstveni_clanki/vakuumist/html/URN_NBN_SI_doc-05YC30MY.html</relation><relation>documents/znanstveni_clanki/vakuumist/pdf/URN_NBN_SI_doc-05YC30MY.pdf</relation><relation>documents/znanstveni_clanki/vakuumist/txt/URN_NBN_SI_doc-05YC30MY.txt</relation><format format_type="volume">17</format><format format_type="issue">4</format><format format_type="main">4 strani</format><format format_type="type">article</format><format format_type="extent">str. 15-18</format><identifier identifier_type="ISSN">0351-9716</identifier><identifier identifier_type="COBISSID">13481511</identifier><identifier identifier_type="URN">URN:NBN:SI:doc-05YC30MY</identifier><language>slv</language><publisher>Društvo za vakuumsko tehniko Slovenije</publisher><source>Vakuumist</source><rights>InC</rights><subject language_type_id="slv">analiza</subject><subject language_type_id="slv">površine</subject><subject language_type_id="slv">spektroskopija</subject><subject language_type_id="slv">tanke plasti</subject><title>Fizikalne osnove metod za analizo površin trdnih snovi in tankih plasti</title><title>Fundamentals of surface and thin film analysis</title></Record>