<Record><identifier xmlns="http://purl.org/dc/elements/1.1/">URN:NBN:SI:DOC-ZK0E3QFG</identifier><date>2007</date><creator>Kač, Uroš</creator><creator>Novak, Franc</creator><relation>documents/znanstveni_clanki/elektrotehniski_vestnik/html/URN_NBN_SI_doc-ZK0E3QFG.html</relation><relation>documents/znanstveni_clanki/elektrotehniski_vestnik/pdf/URN_NBN_SI_doc-ZK0E3QFG.pdf</relation><relation>documents/znanstveni_clanki/elektrotehniski_vestnik/txt/URN_NBN_SI_doc-ZK0E3QFG.txt</relation><format format_type="issue">3</format><format format_type="main">7 strani</format><format format_type="volume">74</format><format format_type="type">article</format><format format_type="extent">str. 92-98</format><identifier identifier_type="ISSN">0013-5852</identifier><identifier identifier_type="COBISSID">21220903</identifier><identifier identifier_type="ISSN">2232-3236</identifier><identifier identifier_type="URN">URN:NBN:SI:doc-ZK0E3QFG</identifier><language>slv</language><publisher>Elektrotehniška zveza Slovenije</publisher><source>Elektrotehniški vestnik</source><rights>InC</rights><subject language_type_id="slv">CMOS</subject><subject language_type_id="slv">filtri S-C</subject><subject language_type_id="slv">integrirana vezja</subject><subject language_type_id="slv">preizkušanje</subject><title>Teoretska izhodišča za izvedbo oscilacijskega preizkusa SC filtrske stopnje drugega reda</title><title>Theoretical background of oscillation-based test of biquad SC filter</title></Record>