{"?xml":{"@version":"1.0"},"edm:RDF":{"@xmlns:dc":"http://purl.org/dc/elements/1.1/","@xmlns:edm":"http://www.europeana.eu/schemas/edm/","@xmlns:wgs84_pos":"http://www.w3.org/2003/01/geo/wgs84_pos","@xmlns:foaf":"http://xmlns.com/foaf/0.1/","@xmlns:rdaGr2":"http://rdvocab.info/ElementsGr2","@xmlns:oai":"http://www.openarchives.org/OAI/2.0/","@xmlns:owl":"http://www.w3.org/2002/07/owl#","@xmlns:rdf":"http://www.w3.org/1999/02/22-rdf-syntax-ns#","@xmlns:ore":"http://www.openarchives.org/ore/terms/","@xmlns:skos":"http://www.w3.org/2004/02/skos/core#","@xmlns:dcterms":"http://purl.org/dc/terms/","edm:WebResource":[{"@rdf:about":"http://www.dlib.si/stream/URN:NBN:SI:DOC-XGEFN38S/e2877dac-634c-414d-993e-934139f5f24f/PDF","dcterms:extent":"435 KB"},{"@rdf:about":"http://www.dlib.si/stream/URN:NBN:SI:DOC-XGEFN38S/06b7d1a9-82fc-4d10-83c2-ee56948d58ad/TEXT","dcterms:extent":"23 KB"}],"edm:TimeSpan":{"@rdf:about":"1985-2025","edm:begin":{"@xml:lang":"en","#text":"1985"},"edm:end":{"@xml:lang":"en","#text":"2025"}},"edm:ProvidedCHO":{"@rdf:about":"URN:NBN:SI:DOC-XGEFN38S","dcterms:isPartOf":[{"@rdf:resource":"https://www.dlib.si/details/URN:NBN:SI:spr-Z2J12Z6C"},{"@xml:lang":"sl","#text":"Informacije MIDEM"}],"dcterms:issued":"1992","dc:creator":["Hrovatin, Rok","Možina, Janez"],"dc:format":[{"@xml:lang":"sl","#text":"letnik:22"},{"@xml:lang":"sl","#text":"številka:3(63)"},{"@xml:lang":"sl","#text":"str. 174-179"}],"dc:identifier":["ISSN:0352-9045","COBISSID_HOST:4380955","URN:URN:NBN:SI:doc-XGEFN38S"],"dc:language":"sl","dc:publisher":{"@xml:lang":"sl","#text":"Strokovno društvo za mikroelektroniko, elektronske sestavne dele in materiale"},"dc:subject":[{"@xml:lang":"sl","#text":"brezkontaktno merjenje"},{"@xml:lang":"en","#text":"contactless measurement"},{"@xml:lang":"sl","#text":"defektoskopi ultrazvočni"},{"@xml:lang":"sl","#text":"detekcija ultrazvoka"},{"@xml:lang":"sl","#text":"interferometri Michelson"},{"@xml:lang":"en","#text":"laser ultrasonics"},{"@xml:lang":"sl","#text":"laserji Nd-YAG"},{"@xml:lang":"sl","#text":"laserji ultravalovni"},{"@xml:lang":"sl","#text":"laserska ultrasonika"},{"@xml:lang":"sl","#text":"meritve brezdotikalne"},{"@xml:lang":"en","#text":"Michelsonov interferometer"},{"@xml:lang":"en","#text":"Michelson's interferometer"},{"@xml:lang":"sl","#text":"NdYAG laserji"},{"@xml:lang":"en","#text":"NdYAG lasers"},{"@xml:lang":"sl","#text":"senzorji malih pomikov"},{"@xml:lang":"en","#text":"small displacement sensors"},{"@xml:lang":"en","#text":"ultrasonic defectoscopes"},{"@xml:lang":"en","#text":"ultrasound detection"},{"@xml:lang":"sl","#text":"ultrazvočni defektoskopi"}],"dcterms:temporal":{"@rdf:resource":"1985-2025"},"dc:title":{"@xml:lang":"sl","#text":"Laserski ultrazvočni defektoskop| Laser ultrasonic defectoscope|"},"dc:description":[{"@xml:lang":"sl","#text":"The construction and the basic operating principles are presented for two interferometric systems for noncontact laser induced ultrasonic displacement measurements. Both system responses are proportional to the displacements on material surface and amplitudes down to the order of magnitude of 0.1 micrometers can be detected. In this paper experiments with varying excitation parameters are discussed with different effects on the ultrasonic wave shape are analyzed"},{"@xml:lang":"sl","#text":"V članku je prikazana zgradba in način delovanja dveh sistemov za brezdotično interferometrsko detekcijo lasersko generiranih ultrazvočnih pomikov. Odziv obeh sistemov je proporcionalen dejanskim odmikom na površini materiala, z njim pa lahko detektiramo pomike reda velikosti 0.1 mikrometrov. V eksperimentalnem delu predstavljamo odzive teh sistemov na lasersko vzbujen ultrazvok pri različnih parametrih, hkrati pa razčlenjujemo vplive na obliko in širjenje ultrazvočnega vala"}],"edm:type":"TEXT","dc:type":[{"@xml:lang":"sl","#text":"znanstveno časopisje"},{"@xml:lang":"en","#text":"journals"},{"@rdf:resource":"http://www.wikidata.org/entity/Q361785"}]},"ore:Aggregation":{"@rdf:about":"http://www.dlib.si/?URN=URN:NBN:SI:DOC-XGEFN38S","edm:aggregatedCHO":{"@rdf:resource":"URN:NBN:SI:DOC-XGEFN38S"},"edm:isShownBy":{"@rdf:resource":"http://www.dlib.si/stream/URN:NBN:SI:DOC-XGEFN38S/e2877dac-634c-414d-993e-934139f5f24f/PDF"},"edm:rights":{"@rdf:resource":"http://rightsstatements.org/vocab/InC/1.0/"},"edm:provider":"Slovenian National E-content Aggregator","edm:intermediateProvider":{"@xml:lang":"en","#text":"National and University Library of Slovenia"},"edm:dataProvider":{"@xml:lang":"sl","#text":"Strokovno društvo za mikroelektroniko, elektronske sestavne dele in materiale"},"edm:object":{"@rdf:resource":"http://www.dlib.si/streamdb/URN:NBN:SI:DOC-XGEFN38S/maxi/edm"},"edm:isShownAt":{"@rdf:resource":"http://www.dlib.si/details/URN:NBN:SI:DOC-XGEFN38S"}}}}