<Record><identifier xmlns="http://purl.org/dc/elements/1.1/">URN:NBN:SI:DOC-WG70EIAW</identifier><date>2008</date><creator>Firpo, Giuseppe</creator><creator>Repetto, Luca</creator><creator>Valbusa, Ugo</creator><relation>documents/znanstveni_clanki/materiali_in_tehnologije/html/urn_nbn_si_doc-wg70eiaw.html</relation><relation>documents/znanstveni_clanki/materiali_in_tehnologije/pdf/urn_nbn_si_doc-wg70eiaw.pdf</relation><relation>documents/znanstveni_clanki/materiali_in_tehnologije/txt/urn_nbn_si_doc-wg70eiaw.txt</relation><format format_type="issue">4</format><format format_type="volume">42</format><format format_type="type">article</format><format format_type="extent">str. 143-149</format><identifier identifier_type="ISSN">1580-2949</identifier><identifier identifier_type="COBISSID">246001920</identifier><identifier identifier_type="URN">URN:NBN:SI:doc-WG70EIAW</identifier><language>eng</language><publisher>Inštitut za kovinske materiale in tehnologije</publisher><source>Materiali in tehnologije</source><rights>InC</rights><subject language_type_id="slv">analizne metode</subject><subject language_type_id="slv">fokusirani ionski curek</subject><subject language_type_id="slv">preiskava materialov</subject><title>Applications of focused ion beam in material science</title><title>Uporaba fokusiranega ionskega curka v znanosti materialov</title></Record>