{"?xml":{"@version":"1.0"},"edm:RDF":{"@xmlns:dc":"http://purl.org/dc/elements/1.1/","@xmlns:edm":"http://www.europeana.eu/schemas/edm/","@xmlns:wgs84_pos":"http://www.w3.org/2003/01/geo/wgs84_pos","@xmlns:foaf":"http://xmlns.com/foaf/0.1/","@xmlns:rdaGr2":"http://rdvocab.info/ElementsGr2","@xmlns:oai":"http://www.openarchives.org/OAI/2.0/","@xmlns:owl":"http://www.w3.org/2002/07/owl#","@xmlns:rdf":"http://www.w3.org/1999/02/22-rdf-syntax-ns#","@xmlns:ore":"http://www.openarchives.org/ore/terms/","@xmlns:skos":"http://www.w3.org/2004/02/skos/core#","@xmlns:dcterms":"http://purl.org/dc/terms/","edm:WebResource":[{"@rdf:about":"http://www.dlib.si/stream/URN:NBN:SI:DOC-W5QYQT4A/9690d8af-eb16-461d-9162-82e413ebbd41/PDF","dcterms:extent":"516 KB"},{"@rdf:about":"http://www.dlib.si/stream/URN:NBN:SI:DOC-W5QYQT4A/f5b2bac1-e669-45d1-9f57-7ffefe203081/TEXT","dcterms:extent":"18 KB"}],"edm:TimeSpan":{"@rdf:about":"1985-2025","edm:begin":{"@xml:lang":"en","#text":"1985"},"edm:end":{"@xml:lang":"en","#text":"2025"}},"edm:ProvidedCHO":{"@rdf:about":"URN:NBN:SI:DOC-W5QYQT4A","dcterms:isPartOf":[{"@rdf:resource":"https://www.dlib.si/details/URN:NBN:SI:spr-Z2J12Z6C"},{"@xml:lang":"sl","#text":"Informacije MIDEM"}],"dcterms:issued":"2004","dc:creator":["Kosi, Andrej","Kramberger, Iztok","Solar, Mitja"],"dc:format":[{"@xml:lang":"sl","#text":"številka:2"},{"@xml:lang":"sl","#text":"letnik:34"},{"@xml:lang":"sl","#text":"str. 107-111"}],"dc:identifier":["ISSN:0352-9045","COBISSID:9271318","URN:URN:NBN:SI:doc-W5QYQT4A"],"dc:language":"sl","dc:publisher":{"@xml:lang":"sl","#text":"Strokovno društvo za mikroelektroniko, elektronske sestavne dele in materiale"},"dc:subject":[{"@xml:lang":"sl","#text":"električne meritve"},{"@xml:lang":"sl","#text":"LabVIEW"},{"@xml:lang":"sl","#text":"merjenje"},{"@xml:lang":"sl","#text":"mikrokrmilniki"},{"@xml:lang":"sl","#text":"polprevodniki"},{"@xml:lang":"sl","#text":"pretvorniki"}],"dcterms:temporal":{"@rdf:resource":"1985-2025"},"dc:title":{"@xml:lang":"sl","#text":"Avtomatizirano merjenje enosmernih karakteristik polprevodniških elementov|"},"dc:description":[{"@xml:lang":"sl","#text":"On field of measuring of one-way characteristics of semiconductor elements we have always the same methods and procedures. Therefore is automation of those methods and procedures a logical step. There are many solutions in this field. Most of them have a very selected purpose, like measuring only certain semiconductor elements. Our goal was to develop as widely designed measuring system as possible. Such approach enables automatic measuring of different semiconductor elements. With our measuring system we can measure simple characteristics and more complex parametric characteristics. General block scheme, properties of measuring system and examples of automatic measuring are shown. In general we have a personal computer on one side and microcontroller on the other side. Personal computer is used to control and present the results of the measuring. To make that possible, a computer program must be developed. The most appropriate tool for that is program package LabVIEW, which enables quick and simple development and possibility toupgrade program with new functions. LabVIEW is a development environment based on graphical programming. LabVIEW uses terminology, icons, and ideas familiar to technicians, scientists, and engineers, and relies on graphical symbols rather than textuallanguage to describe programming actions. Further advantage of such design is the possibility of simple extension with new functions. For example in future different analyses of acquired data could be implemented. Microcontroller on the other side regulates control and data signals of DA-converter, AD-converter and multiplexer. Our measuring system has two independent analog outputs with voltage range :t15V and :t1A current. Voltage range of :t15V is enough for measuring characteristic of most popular semiconductors. With 16-8it DA-converter we have achieved accuracy of output value in range :t 1 mV. Measuring system can measure up to six input channels. At the end of the article one example of automatic measuring of simple characteristics and one of more complex parametric characteristics is shown. Also comparison with commercial measuring card with similar characteristic is shown. Advantage of our measuring system is wider measuring area, better current efficiency and lower price of system"},{"@xml:lang":"sl","#text":"V prispevku obravnavamo avtomatizirano merjenje enosmernih karakteristik polprevodniških elementov. Na področju avtomatiziranega merjenja karakteristik obstajajo številne rešitve. Večina le-teh je ozko namenska in omogočajo merjenje le določenih polprevodniških elementov. Cilj je razviti široko zasnovan merilni sistem, ki bo omogočal avtomatsko merjenje različnih polprevodniških elementov. Takšna izvedba omogoča merjenje enostavnih karakteristik na primer diode in merjenje bolj kompleksnih parametričnih karakteristik na primer tranzistorja. Dodatna prednost take zasnove je možnost enostavne razširitve z novimi funkcijami na primer z raznimi analizami izmerjenih podatkov. Prikazani so splošna blokovna shema, lastnosti merilnega sistema in merilni rezultati. za nastavljanje vrednosti vhodnih signalov in merjenje izhodnih je uporabljen mikrokrmilnik, za nadzor, predstavitev rezultatov, hranjenje vrednosti in obdelavo pa osebni računalnik. Zasnova merilnega sistema omogoča prosto izbiro programskega orodja, ki ga bomo uporabljali na osebnem računalniku. V našem primeru smo izbrali programski paket LabVIEW, ki omogoča hiter in enostaven razvoj, ter možnost nadgradnje programa z novimi funkcijami. Predstavljeni so primeri avtomatiziranih meritev in primerjava našega merilnega sistema s komercialno merilno kartico. Prednost našega merilnega sistema je predvsem v širšem merilnem območju merjenja, bistveno boljši tokovni zmogljivosti in cenovni ugodnosti sistema"}],"edm:type":"TEXT","dc:type":[{"@xml:lang":"sl","#text":"znanstveno časopisje"},{"@xml:lang":"en","#text":"journals"},{"@rdf:resource":"http://www.wikidata.org/entity/Q361785"}]},"ore:Aggregation":{"@rdf:about":"http://www.dlib.si/?URN=URN:NBN:SI:DOC-W5QYQT4A","edm:aggregatedCHO":{"@rdf:resource":"URN:NBN:SI:DOC-W5QYQT4A"},"edm:isShownBy":{"@rdf:resource":"http://www.dlib.si/stream/URN:NBN:SI:DOC-W5QYQT4A/9690d8af-eb16-461d-9162-82e413ebbd41/PDF"},"edm:rights":{"@rdf:resource":"http://rightsstatements.org/vocab/InC/1.0/"},"edm:provider":"Slovenian National E-content Aggregator","edm:intermediateProvider":{"@xml:lang":"en","#text":"National and University Library of Slovenia"},"edm:dataProvider":{"@xml:lang":"sl","#text":"Strokovno društvo za mikroelektroniko, elektronske sestavne dele in materiale"},"edm:object":{"@rdf:resource":"http://www.dlib.si/streamdb/URN:NBN:SI:DOC-W5QYQT4A/maxi/edm"},"edm:isShownAt":{"@rdf:resource":"http://www.dlib.si/details/URN:NBN:SI:DOC-W5QYQT4A"}}}}