<Record><identifier xmlns="http://purl.org/dc/elements/1.1/">URN:NBN:SI:DOC-W5QYQT4A</identifier><date>2004</date><creator>Kosi, Andrej</creator><creator>Kramberger, Iztok</creator><creator>Solar, Mitja</creator><relation>documents/doc/W/URN_NBN_SI_doc-W5QYQT4A_001.pdf</relation><relation>documents/doc/W/URN_NBN_SI_doc-W5QYQT4A_001.txt</relation><format format_type="issue">2</format><format format_type="volume">34</format><format format_type="type">article</format><format format_type="extent">str. 107-111</format><identifier identifier_type="ISSN">0352-9045</identifier><identifier identifier_type="COBISSID">9271318</identifier><identifier identifier_type="URN">URN:NBN:SI:doc-W5QYQT4A</identifier><language>slv</language><publisher>Strokovno društvo za mikroelektroniko, elektronske sestavne dele in materiale</publisher><source>Informacije MIDEM</source><rights>InC</rights><subject language_type_id="slv">električne meritve</subject><subject language_type_id="slv">LabVIEW</subject><subject language_type_id="slv">merjenje</subject><subject language_type_id="slv">mikrokrmilniki</subject><subject language_type_id="slv">polprevodniki</subject><subject language_type_id="slv">pretvorniki</subject><title>Avtomatizirano merjenje enosmernih karakteristik polprevodniških elementov</title></Record>