<Record><identifier xmlns="http://purl.org/dc/elements/1.1/">URN:NBN:SI:DOC-STCK89QC</identifier><date>2000</date><creator>Smith, K. M.</creator><relation>documents/doc/S/URN_NBN_SI_doc-STCK89QC_001.pdf</relation><relation>documents/doc/S/URN_NBN_SI_doc-STCK89QC_001.txt</relation><format format_type="issue">1</format><format format_type="volume">30</format><format format_type="type">article</format><format format_type="extent">str. 1-15</format><identifier identifier_type="ISSN">0352-9045</identifier><identifier identifier_type="COBISSID">1926996</identifier><identifier identifier_type="URN">URN:NBN:SI:doc-STCK89QC</identifier><language>eng</language><publisher>Strokovno društvo za mikroelektroniko, elektronske sestavne dele in materiale</publisher><source>Informacije MIDEM</source><rights>InC</rights><subject language_type_id="slv">detektorji</subject><subject language_type_id="slv">polprevodniki</subject><subject language_type_id="slv">preskušanje</subject><subject language_type_id="slv">računalniška grafika</subject><title>Polprevodniški detektorji s slikovnimi elementi</title><title>Semiconductor pixel detectors</title></Record>