A multi-objective feature selection and self-paced ensemble framework for semiconductor defect detection

URN:NBN:SI:DOC-PASCPMEJ2025Gao, X.Jing, G.Liu, Y.Yang, M.Yang, X.Zheng, H.documents/doc/P/URN_NBN_SI_doc-PASCPMEJ_001.pdfdocuments/doc/P/URN_NBN_SI_doc-PASCPMEJ_001.txt204articlestr. 458-47410.14743/apem2025.4.5521854-6250265921027URN:NBN:SI:doc-PASCPMEJengFakulteta za strojništvo, Inštitut za proizvodno strojništvoAdvances in production engineering and managementBYclass imbalanceclass overlapdefect detectioniskanje napakmachine learningmulti-objective feature selectionpreverjanje kakovostiquality inspectionself-paced ensemblesemiconductor manufacturingstrojno učenjeA multi-objective feature selection and self-paced ensemble framework for semiconductor defect detection