URN:NBN:SI:DOC-MHE3R5AG2010Nagel, WernerOhser, JoachimWeiss, Violadocuments/doc/M/URN_NBN_SI_doc-MHE3R5AG_001.htmdocuments/doc/M/URN_NBN_SI_doc-MHE3R5AG_001.pdfdocuments/doc/M/URN_NBN_SI_doc-MHE3R5AG_001.txt229articlestr. 121-1311580-313927995353URN:NBN:SI:doc-MHE3R5AGengDruštvo za stereologijo in kvantitativno analizo slike, Medicinska fakultetaImage analysis and stereologyInCobdelava slikstatistični modelistohastični procesiSecond moment measure and K-function for planar STIT tessellations