33 KB381 KB30 KB200020242011Kovač, Janezštevilka:3letnik:45str. 191-197ISSN:1580-2949COBISSID:857770URN:URN:NBN:SI:doc-L3WPTIAJenInštitut za kovinske materiale in tehnologijeMateriali in tehnologijebombažkarakterizacija materialovpolimerirentgenska fotoelektronska spektroskopijaspektroskopija sekundarnih ionovSurface characterization of polymers by XPS and SIMS techniques| Analiza površine polimerov z metodama XPS in SIMS|Polymers are very often subjects of different surface treatments. To understand and control the basic processes during surfaces modifications, analyses with advanced analytical techniques are required. We present two of such state of the art techniques, X-ray photoelectron spectroscopy - XPS and secondary ion mass spectroscopy - SIMS, often applied for characterization of polymers surfaces. In this work we give an overview of these techniques and their advantages and limitations related to polymer characterization. The combined use of these techniques is demonstrated in the application example, in which the cotton fibers were characterized before and after deposition of fluorine-based thin coatingPolimerni materiali so pogosto predmet površinskih obdelav. Za razumevanje in kontrolo osnovnih procesov, ki potekajo med površinskimi modifikacijami, je potrebna uporaba naprednih analitskih tehnik. Predstavljamo dve takšni moderni tehniki: rentgensko fotoelektronsko spektroskopijo - XPS in masno spektroskopijo sekundarnih ionov - SIMS, ki se pogosto uporabljata pri karakterizaciji površin polimernih materialov. V delu predstavljamo osnove teh tehnik ter njihove prednosti in omejitve, povezane s preiskavo polimerov. Kombinirana uporaba obeh analitskih tehnik je predstavljena na primeru preiskave bombažnih vlaken pred nanosom tanke plasti na osnovi fluorovih spojin in po njemTEXTznanstveno časopisjejournalsSlovenian National E-content AggregatorNational and University Library of SloveniaInštitut za kovinske materiale in tehnologije