URN:NBN:SI:DOC-KTYAR2B92001Donnadieu, PatriciaDouin, JoelEpicier, ThierryMatsuda, Kenjidocuments/znanstveni_clanki/image_analysis_and_stereology/html/urn_nbn_si_doc-age0jv66.htmldocuments/znanstveni_clanki/image_analysis_and_stereology/pdf/urn_nbn_si_doc-age0jv66.pdfdocuments/znanstveni_clanki/image_analysis_and_stereology/txt/urn_nbn_si_doc-age0jv66.txt2036 straniarticlestr. 213-2181580-313916038617URN:NBN:SI:doc-KTYAR2B9engDruštvo za stereologijo in kvantitativno analizo slike, Medicinska fakultetaImage analysis and stereologyInCAluminijeve spojineAluminum Compoundselektronska mikroskopijaImage Processing, Computer-AssistedMicroscopy, ElectronMikroskopija elektronskapreiskava materialaSlika, obdelava z računalnikomMeasurements of strain fields due to nanoscale precipitates using the phase image method