16 KB621 KB14 KB200020242010Donik, ČrtomirJenko, MonikaMandrino, DjordjePaulin, Irenaštevilka:2letnik:44str. 73-76ISSN:1580-2949COBISSID:803498URN:URN:NBN:SI:doc-K4LVGR4QenInštitut za kovinske materiale in tehnologijeMateriali in tehnologijeAugerjeva spektroskopijarentgenska fotoelektronska spektroskopijasintezatitanov hidridAES and XPS characterization of titanium hydride powder| Preiskave praška titanovega hidrida s spektroskopijo Augerjevih elektronov in rentgensko fotoelektronsko spektroskopijo|Titanium hydride powder, manufactured by ball milling titanium in a hydrogen atmosphere down to micron-sized particles, was analyzed by X-ray Photoelectron Spectroscopy (XPS). A strong titanium oxide signal was also measured, which decreased some what after intense sputtering of the sample, but was impossible to get rid of completely. This was probably due to the high surface/volume ratio of each TiHsubx particle, which contributes to a substantial titanium oxide/TiHsubx ratio, and due to the surface morphology of the powder sample, which leaves a considerable part of the oxide layer shaded during the sputtering. Auger Electron Spectroscopy (AES) was then employed and some characteristic differences in the shape of the Ti LMM spectra between the TiHsubx and Ti were observed; however, they can be ascribed to the TiHsubx only after a comparison with the same types of spectra measured on titanium oxide. An additional XPS measurement was performed with TiHsubx powder and powdered Ti. The peaks were fitted with Ti oxide and metallic Ti components and the shifts of the metallic component between the Ti and TiHsubx (a shift of 0.4 eV was expected) were checked forPrašek titanovega hidrida, sintetiziran z mletjem titana v krogličnem mlinčku v vodikovi atmosferi do mikrometrske velikosti delcev, smo analizirali z rentgensko fotoelektronsko spektroskopijo (XPS). Pri tem smo izmerili močan signal titanovega oksida, ki je sicer upadel po intenzivnem ionskem jedkanju površine vzorca, ni pa izginil. Verjeten razlog je visoko razmerje površina/volumen posameznih delcev TiHspodajx, ki prispeva k znatnemu razmerju titanov oksid/TiHspodajx, kakor tudi morfologija površine praškastega vzorca zaradi katere je del oksida zasenčen med ionskim jedkanjem. S spektroskopijo Augerjevih elektronov (AES) smo opazili nekatere karakteristične razlike v obliki Ti LMM-spektrov med TiHspodajx in Ti, vendar jih je bilo mogoče pripisati TiHspodajx šele po primerjavi z enakim tipom spektrov, izmerjenih pri titanovem oksidu. Nadaljnjo meritev XPS smo opravili pri prašku Ti. Določili smo oksidne in kovinske komponente vrhov in preverjali premike kovinskih komponent pri TiHspodajx glede na Ti (premika naj bi bil 0,4 eV)TEXTznanstveno časopisjejournalsSlovenian National E-content AggregatorNational and University Library of SloveniaInštitut za kovinske materiale in tehnologije