<Record><identifier xmlns="http://purl.org/dc/elements/1.1/">URN:NBN:SI:DOC-IX5HYTZR</identifier><date>2011</date><creator>Chaudhry, Amit</creator><creator>Roy, Jatindra Nath</creator><creator>Sangwan, Sonu</creator><relation>documents/doc/I/URN_NBN_SI_doc-IX5HYTZR_001.htm</relation><relation>documents/doc/I/URN_NBN_SI_doc-IX5HYTZR_001.pdf</relation><relation>documents/doc/I/URN_NBN_SI_doc-IX5HYTZR_001.txt</relation><format format_type="issue">5</format><format format_type="volume">78</format><format format_type="type">article</format><format format_type="extent">str. 298-303</format><identifier identifier_type="ISSN">0013-5852</identifier><identifier identifier_type="ISSN">2232-3236</identifier><identifier identifier_type="COBISSID">262390272</identifier><identifier identifier_type="URN">URN:NBN:SI:doc-IX5HYTZR</identifier><language>slv</language><publisher>Elektrotehniška zveza Slovenije</publisher><source>Elektrotehniški vestnik</source><rights>InC</rights><subject language_type_id="slv">CMOS</subject><subject language_type_id="slv">mikroelektronika</subject><title>Mobility modeling in a p-MOSFET under uniaxial stress</title></Record>