<Record><identifier xmlns="http://purl.org/dc/elements/1.1/">URN:NBN:SI:DOC-GID8GKFZ</identifier><date>2016</date><creator>Bhuvaneswari, M. C.</creator><creator>Shanthi, M.</creator><relation>documents/doc/G/URN_NBN_SI_doc-GID8GKFZ_001.pdf</relation><relation>documents/doc/G/URN_NBN_SI_doc-GID8GKFZ_001.txt</relation><format format_type="issue">4</format><format format_type="volume">46</format><format format_type="type">article</format><format format_type="extent">str. 209-218</format><identifier identifier_type="ISSN">0352-9045</identifier><identifier identifier_type="COBISSID">291297024</identifier><identifier identifier_type="URN">URN:NBN:SI:doc-GID8GKFZ</identifier><language>eng</language><publisher>Strokovno društvo za mikroelektroniko, elektronske sestavne dele in materiale</publisher><source>Informacije MIDEM</source><rights>InC</rights><subject language_type_id="slv">analogna vezja</subject><subject language_type_id="slv">nevronske mreže</subject><subject language_type_id="slv">odkrivanje napak</subject><subject language_type_id="slv">strojno učenje</subject><title>Fault detection in state variable filter circuit using Kernel extreme learning machine (KELM) algorithm</title><title>Iskanje napak v filtru na osnovi spremenljivk stanja z algoritmom ekstremnega strojnega učenja na osnovi jedrne funkcije (KELM)</title></Record>