<Record><identifier xmlns="http://purl.org/dc/elements/1.1/">URN:NBN:SI:DOC-FM48K4MU</identifier><date>2005</date><creator>Dolinar, Drago</creator><creator>Milanovič, Miro</creator><creator>Težak, Oto</creator><relation>documents/doc/F/URN_NBN_SI_doc-FM48K4MU_001.pdf</relation><relation>documents/doc/F/URN_NBN_SI_doc-FM48K4MU_001.txt</relation><format format_type="issue">2</format><format format_type="volume">35</format><format format_type="type">article</format><format format_type="extent">str. 65-71</format><identifier identifier_type="ISSN">0352-9045</identifier><identifier identifier_type="COBISSID">9875990</identifier><identifier identifier_type="URN">URN:NBN:SI:doc-FM48K4MU</identifier><language>eng</language><publisher>Strokovno društvo za mikroelektroniko, elektronske sestavne dele in materiale</publisher><source>Informacije MIDEM</source><rights>InC</rights><subject language_type_id="slv">aproksimacijska funkcija</subject><subject language_type_id="slv">diferenčna evolucija</subject><subject language_type_id="slv">izgube</subject><subject language_type_id="slv">pretvorniki</subject><subject language_type_id="slv">razbremenilna vezja</subject><title>Experimental determination of the MOSFET turn-off snubber capacitor</title></Record>